Fine electron biprism on a Si-on-insulator chip for off-axis electron holography-Reference-Cited by-同舟云学术

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Fine electron biprism on a Si-on-insulator chip for off-axis electron holography

Published:2018-02 Issue: Volume:185 Page:81-89
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Duchamp Martial,Girard Olivier,Pozzi Giulio,Soltner Helmut,Winkler Florian,Speen Rolf,Dunin-Borkowski Rafal E.,Cooper David

Funder

European Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. A new microscopic principle;Gabor;Nature,1948

2. Electron holography;Tonomura,1995

3. Electron Holography;Tonomura,1999

4. Introduction to Electron Holography;Völkl,1999

5. Electron holography—basics and applications;Lichte;Rep. Prog. Phys.,2008

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 3;2022

2. Control of quantum electrodynamical processes by shaping electron wavepackets;Nature Communications;2021-03-17

3. Investigation of gas-electron interactions with electron holography;Ultramicroscopy;2021-02

4. Electron Holography in Gaseous and Liquid Environment;Microscopy and Microanalysis;2020-07-30

5. Magnetic Imaging of Nanostructures Using Off-Axis Electron Holography;Handbook of Magnetic Materials;2018

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