Image distortions in SEM and their influences on EBSD measurements
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Electron Backscatter Diffraction in Materials Science;Schwartz,2000
2. J.P. Kapur, D. Casasent, Geometric correction of SEM images, in: SPIE, vol. 4044, pp. 165–176, April 2000, #02.
3. Mapping the mesoscale interface structure in polycrystalline materials
4. Combined application of electron backscatter diffraction and stereo-photogrammetry in fractography studies
5. A comparison between three-dimensional and two-dimensional grain boundary plane analysis
Cited by 113 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Full-field measurements of the microstructure’s effect on the mechanical behaviour of a wire and arc additively manufactured duplex stainless steel;Materials & Design;2024-08
2. 3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry;Integrating Materials and Manufacturing Innovation;2024-07-24
3. Evaluating scanning electron microscopy for the measurement of small-scale topography;Surface Topography: Metrology and Properties;2024-07-15
4. On the role of geometrically necessary dislocations in void formation and growth in response to shock loading conditions in wrought and additively manufactured Ta;Journal of Materials Research and Technology;2024-07
5. Postprocessing Workflow for Laboratory Diffraction Contrast Tomography: A Case Study on Chromite Geomaterials;Microscopy and Microanalysis;2024-05-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3