Quantitative secondary electron energy filtering in a scanning electron microscope and its applications
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Factors Affecting Contrast and Resolution in the Scanning Electron Microscope†
2. A voltage contrast detector for the SEM
3. False peaks in the energy distribution of secondary electrons measured with a spherical retarding field analyser
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