Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy-Reference-Cited by-同舟云学术

Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy

Published:2009-07 Issue:8 Volume:109 Page:952-957
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Jiang C.-S.,Ptak A.,Yan B.,Moutinho H.R.,Li J.V.,Al-Jassim M.M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Thin-film solar cells: device measurements and analysis

5. Characterization of amorphous/crystalline silicon interfaces from electrical measurements

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