Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging-Reference-Cited by-同舟云学术

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Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging

Published:2009-07 Issue:8 Volume:109 Page:929-936
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Stan G.,Krylyuk S.,Davydov A.V.,Vaudin M.D.,Bendersky L.A.,Cook R.F.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment

2. Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever

3. Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope

4. Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies

5. Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy

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