Image deformation in field ion microscopy of faceted crystals
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference34 articles.
1. Field Ion Microscopy;Müller,1969
2. Atom-probe Field Ion Microscopy;Tsong,1990
3. Atom Probe Field Ion Microscopy;Miller,1996
4. Faceting induced by ultrathin metal films: structure, electronic properties and reactivity
5. Coexistence of {011} facets with {112} facets on W(111) induced by ultrathin films of Pd
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