Full tip imaging in atom probe tomography-Reference-Cited by-同舟云学术

Full tip imaging in atom probe tomography

Published:2013-01 Issue: Volume:124 Page:96-101
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Du Sichao,Burgess Timothy,Tjing Loi Shyeh,Gault Baptiste,Gao Qiang,Bao Peite,Li Li,Cui Xiangyuan,Kong Yeoh Wai,Hoe Tan Hark,Jagadish Chennupati,Ringer Simon P.,Zheng Rongkun

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Atom Probe Tomography: Analysis at the Atomic Level;Miller,2000

2. Advanced nanostructural analysis of aluminium alloys using atom probe tomography;Ringer;Material Science Forum,2006

3. Three-dimensional atom-probe tomography: advances and applications;Seidman;Annual Review of Materials Research,2007

4. Structural materials: understanding atomic-scale microstructures;Marquis;MRS Bulletin,2009

5. Atom-probe tomographic studies of thin films and multilayers;Larson;MRS Bulletin,2009

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