Probing the probe: AFM tip-profiling via nanotemplates to determine Hamaker constants from phase–distance curves

Author:

Rodriguez Raul D.,Lacaze Emmanuelle,Jupille Jacques

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Dynamic atomic force microscopy methods;Garcia;Surface Science Reports,2002

2. Atomic force microscopy and spectroscopy;Seo;Reports on Progress in Physics,2008

3. Aspects of scanning force microscope probes and their effects on dimensional measurement;Yacoot;Journal of Physics D: Applied Physics,2008

4. The direct measurement of normal and retarded van der Waals forces;Tabor;Proceedings of the Royal Society London A,1969

5. The calculation of hamaker constants from Liftshitz theory with applications to wetting phenomena;Hough;Advances in Colloid and Interface Science,1980

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