State of the art in atomic resolution off-axis electron holography

Author:

Linck Martin,Freitag Bert,Kujawa Stephan,Lehmann Michael,Niermann Tore

Funder

European Union

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

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3. Detection of single atoms and burried defects in three dimensions by aberration-corrected electron microscope with 0.5-angstrom information limit;Kisielowski;Microscopy and Microanalysis,2008

4. First performance measurements and application results of a new high brightness Schottky emitter for HR-S/TEM at 80–300kV acceleration voltage;Freitag;Proceedings of EMC,2008

5. Sphärische und chromatische Korrektur von Elektronen-Linsen;Scherzer;Journal of Applied Physics,1949

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