Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size-Reference-Cited by-同舟云学术

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size

Published:2013-02 Issue: Volume:125 Page:1-9
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Jiang J.,Britton T.B.,Wilkinson A.J.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

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4. Geometrically necessary dislocation and size-dependent plasticity;Gao;Scripta Materialia,2003

5. The deformation of plastically non-homogeneous materials;Ashby;Philosophical Magazine,1970

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