Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithm
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
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2. Advances in automatic EBSP single orientation measurements;Kunze;Textures and Microstructures,1993
3. Three dimensional characterization of microstructure by electron back-scatter diffraction;Rollett;Annual Review of Material Research,2007
4. The characterization of low-angle boundaries by EBSD;Bate;Journal of Microscopy,2005
5. Automatic grain boundary detection and grain size analysis using polarization micrographs or orientation images;Heilbronner;Journal of Structural Geology,2000
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