A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns-Reference-Cited by-同舟云学术

A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns

Published:2011-06 Issue:7 Volume:111 Page:841-846
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Nakashima Philip N.H.,Moodie Alexander F.,Etheridge Joanne

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. J. Etheridge, A.F. Moodie, C.J. Humphreys, Direct measurement of structure amplitudes from three beam interactions, electron microscopy, in: Proceedings of the 14th International Congress on Electron Microscopy, vol. III, 1998, pp. 737.

2. Structural phase and amplitude measurement from distances in convergent beam electron diffraction patterns;Nakashima;Acta Crystallogr. A,2007

3. A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction;Nakashima;Ultramicroscopy,2008

4. Some problems in imaging and inversion;Moodie;Chem. Scr.,1978

5. The symmetry of three-beam scattering equations: inversion of three-beam diffraction patterns from centrosymmetric crystals;Moodie;Acta Crystallogr. A,1996

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