Interface location by depth sectioning using a low-angle annular dark field detector-Reference-Cited by-同舟云学术

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Interface location by depth sectioning using a low-angle annular dark field detector

Published:2012-02 Issue: Volume:113 Page:131-138
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ruben Gary,Cosgriff Eireann C.,D'Alfonso Adrian J.,Findlay Scott D.,LeBeau James M.,Allen Leslie J.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference35 articles.

1. A novel approach for measuring ultra-thin, buried SiO2 film thickness

2. Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

3. High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

4. Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images

5. New methods of imaging surfaces (and buried interfaces)

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1. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution;Ultramicroscopy;2022-03

2. Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy;Microscopy and Microanalysis;2021-08-20

3. Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron microscope;Ultramicroscopy;2020-02

4. STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network;Ultramicroscopy;2020-01

5. 4D-Data Acquisition in Scanning Confocal Electron Microscopy for Depth-Sectioned Imaging;e-Journal of Surface Science and Nanotechnology;2018-06-09

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