Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)-Reference-Cited by-同舟云学术

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Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Published:2020-07 Issue: Volume:214 Page:112989
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Gholinia Ali,Curd Matthew E.,Bousser Etienne,Taylor Kevin,Hosman Thijs,Coyle Steven,Shearer Michael Hassel,Hunt John,Withers Philip J.

Funder

HEFCE

UKRPIF

Manchester RPIF Round 2

EPSRC

Henry Royce Institute

European Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. Serial sectioning for three dimensional materials science;Echlin;Curr. Opin. Solid State Mater. Sci.,2020

2. Broad ion beam serial section tomography;Winiarski;Ultramicroscopy,2017

3. IPrep – automated serial-section broad-ion-beam tomography;Hosman;Microsc. Microanal.,2016

4. Large volume serial section tomography by Xe Plasma FIB dual beam microscopy;Burnett;Ultramicroscopy,2016

5. A 3-D EBSD investigation of dynamic recrystallization in a Cu-Sn bronze;Gholinia;Microsc. Microanal.,2009

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