Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning-Reference-Cited by-同舟云学术

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Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning

Published:2020-12 Issue: Volume:219 Page:113132
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

McAuliffe T.P.,Dye D.,Britton T.B.

Funder

Rolls-Royce plc - EPSRC Strategic Partnership in Structural Metallic Systems

Centre for Doctoral Training in Advanced Characterisation of Materials

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference39 articles.

1. High-resolution electron microscopy of dislocation ribbons in a CMSX-4 superalloy single crystal;Vorontsov;Acta Mater.,2012

2. The role of stacking fault shear in the primary creep of [001]-oriented single crystal superalloys at 750°C and 750 MPa;Rae;Mater. Sci. Eng. A,2001

3. Creep of CMSX-4 superalloy single crystals: effects of rafting at high temperature;Reed;Acta Metall.,1999

4. Determination of crystal phase from an electron backscatter diffraction pattern;Dingley;J. Appl. Crystallogr.,2009

5. Crystallometric and projective properties of Kikuchi diffraction patterns;Nolze;J. Appl. Crystallogr.,2017

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