Coherent x-ray scattering in an XPEEM setup-Reference-Cited by-同舟云学术

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Coherent x-ray scattering in an XPEEM setup

Published:2020-09 Issue: Volume:216 Page:113035
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Menteş T.O.,Genuzio F.,Schánilec V.,Sadílek J.,Rougemaille N.,Locatelli A.

Funder

Agence Nationale de la Recherche

CEITEC

Horizon 2020

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Prospects for long-wavelength x-ray microscopy and diffraction;Sayre,1980

2. Reconstruction of an object from the modulus of its fourier transform;Fienup;Opt. Lett.,1978

3. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens

4. Some implications of a theorem due to Shannon

5. Beyond crystallography: Diffractive imaging using coherent x-ray light sources

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