Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV-Reference-Cited by-同舟云学术

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Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV

Published:2021-01 Issue: Volume:220 Page:113144
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Mikmeková Šárka,Aoyama Tomohiro

Funder

Technology Agency of the Czech Republic

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Surface Microscopy with Low Energy Electrons;Bauer,2014

2. Scanning low-energy electron microscopy;Müllerová;Adv. Imaging Electron Phys.,2003

3. Image Formation in Low-Voltage Scanning Electron Microscopy;Reimer,1993

4. Low Voltage Electron Microscopy – Principles and Applications;Bell,2013

5. Very low energy scanning electron microscopy;Frank;Nucl. Instrum. Methods Phys. Res. A,2011

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1. Contrast mechanism at landing energy near 0 eV in super low-energy scanning electron microscopy;Microscopy;2023-08-24

2. Electron reflectivity from clean and oxidized steel surface;Surface and Interface Analysis;2022-02-24

3. Out-of-plane displacement measurement for an optical fiber image transmission element using optical flow;Applied Optics;2021-11-08

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