Bayesian approach to automatic mass-spectrum peak identification in atom probe tomography-Reference-Cited by-同舟云学术

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Bayesian approach to automatic mass-spectrum peak identification in atom probe tomography

Published:2020-08 Issue: Volume:215 Page:113014
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Mikhalychev A.,Vlasenko S.,Payne T.R.,Reinhard D.A.,Ulyanenkov A.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference50 articles.

1. Atom probe tomography;Kelly;Rev. Sci. Instrum.,2007

2. Atom probe tomography 2012;Kelly;Annu. Rev. Mater. Res.,2012

3. Three-dimensional nanoscale characterisation of materials by atom probe tomography;Devaraj;Int. Mater. Rev.,2017

4. Local Electrode Atom Probe Tomography;Larson,2013

5. Guided mass spectrum labelling in atom probe tomography;Haley;Ultramicroscopy,2015

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1. 3D deep learning for enhanced atom probe tomography analysis of nanoscale microstructures;Acta Materialia;2024-10

2. Fisher information for optimal planning of X-ray diffraction experiments;Journal of Applied Crystallography;2021-11-16

3. Community-Driven Methods for Open and Reproducible Software Tools for Analyzing Datasets from Atom Probe Microscopy;Microscopy and Microanalysis;2021-07-27

4. Machine-learning-enhanced time-of-flight mass spectrometry analysis;Patterns;2021-02

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