Atom probe crystallography: Characterization of grain boundary orientation relationships in nanocrystalline aluminium-Reference-Cited by-同舟云学术

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Atom probe crystallography: Characterization of grain boundary orientation relationships in nanocrystalline aluminium

Published:2011-05 Issue:6 Volume:111 Page:493-499
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Moody Michael P.,Tang Fengzai,Gault Baptiste,Ringer Simon P.,Cairney Julie M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Origin of the spatial resolution in atom probe microscopy;Gault;Applied Physics Letters,2009

2. Spatial resolution in atom probe microscopy;Gault;Microscopy and Microanalysis,2010

3. Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors;Cadel;Journal of Applied Physics,2009

4. Observation of atomic planes in 3DAP analysis;Warren;Ultramicroscopy,1998

5. Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe;Vurpillot;Journal of Microscopy—Oxford,2004

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