Precession electron diffraction using a digital sampling method-Reference-Cited by-同舟云学术

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Precession electron diffraction using a digital sampling method

Published:2010-12 Issue:1 Volume:111 Page:47-55
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zhang Daliang,Grüner Daniel,Oleynikov Peter,Wan Wei,Hovmöller Sven,Zou Xiaodong

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Double conical beam-rocking system for measurement of integrated electron diffraction intensities

2. Structure Model for the Phase AlmFe Derived from Three-Dimensional Electron Diffraction Intensity Data Collected by a Precession Technique. Comparison with Convergent-Beam Diffraction

3. Advances in imaging and electron physics;Gemmi,2002

4. Quantitative Analyses of Precession Diffraction Data for a Large Cell Oxide

5. NanoMEGAS. 〈http://www.nanomegas.com/〉.

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1. Modelling fine-sliced three dimensional electron diffraction data with dynamical Bloch-wave simulations;IUCrJ;2023-01-01

2. Aluminosilicate Zeolite EMM-28 Containing Supercavities Determined by Continuous Rotation Electron Diffraction;Inorganic Chemistry;2022-07-11

3. Quantitative order‐parameter measurement in lattice‐mismatched AlInP using precession electron diffraction;Journal of Microscopy;2021-07-14

4. Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns;Journal of Applied Crystallography;2021-05-28

5. Serial electron crystallography for structure determination and phase analysis of nanocrystalline materials;Journal of Applied Crystallography;2018-08-09

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