A new method for the reconstruction of micro- and nanoscale planar periodic structures
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. Study of the surface structure of butterfly wings using the scanning electron microscopic moiré method;Kishimoto;Applied Optics,2007
2. Structural inversion in 3-D hexagonal organization of coil–rod–coil molecule;Jin;Chemical Communications,2005
3. Structural inversion of micellar block copolymer thin films;Li;Macromolecules,2006
4. Spin-relaxation suppression by compensation of bulk and structural inversion asymmetries in [111]-oriented quantum wells;Vurgaftman;Journal of Applied Physics,2005
5. Generation of electron moiré fringes on designed nanoporous anodic alumina films and their replicated Ni cone arrays: exploration of domain sizes and nanopore arrangements;Yamauchi;Journal of Physical Chemistry C,2009
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