Laser assisted field evaporation of oxides in atom probe analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Tomographic analysis of dilute impurities in semiconductor nanostructures
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3. Pulsed‐laser time‐of‐flight atom‐probe field ion microscope
4. IN SITU ION MILLING OF FIELD ION SPECIMENS USING A LIQUID METAL ION SOURCE
5. Atom Probe Tomography of Electronic Materials
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