Nanobeam diffraction fluctuation electron microscopy technique for structural characterization of disordered materials—Application to Al88−xY7Fe5Tix metallic glasses-Reference-Cited by-同舟云学术

Nanobeam diffraction fluctuation electron microscopy technique for structural characterization of disordered materials—Application to Al88−xY7Fe5Tix metallic glasses

Published:2010-09 Issue:10 Volume:110 Page:1279-1289
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Daulton T.L.,Bondi K.S.,Kelton K.F.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference49 articles.

1. The structure of amorphous hydrogenated silicon and its alloys: A review

2. Disordered Materials, An Introduction;Ossi,2003

3. The Study of Nanovolumes of Amorphous Materials Using Electron Scattering

4. Chapter 7. Neutron and X-ray diffraction studies of concentrated aqueous electrolyte solutions

5. 8 Neutron and X-ray diffraction studies on complex liquids

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