Author:
Fleming A.J.,Kenton B.J.,Leang K.K.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference51 articles.
1. Probing physical properties at the nanoscale;Brukman;Physics Today,2008
2. Towards nanomicrobiology using atomic force microscopy;Dufrêne;Nature Reviews Microbiology,2008
3. A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences;Jalili;Mechatronics,2004
4. Scanning probe microscopy;Meyer,2004
5. B. Bhushan, H. Fuchs (Eds.), Applied Scanning Probe Methods (I–X), Springer-Verlag, Heidelberg, Germany, 2006.
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