Higher-order aberration corrector for an image-forming system in a transmission electron microscope-Reference-Cited by-同舟云学术

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Higher-order aberration corrector for an image-forming system in a transmission electron microscope

Published:2010-07 Issue:8 Volume:110 Page:958-961
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Sawada H.,Sasaki T.,Hosokawa F.,Yuasa S.,Terao M.,Kawazoe M.,Nakamichi T.,Kaneyama T.,Kondo Y.,Kimoto K.,Suenaga K.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Electron microscopy image enhanced

2. Towards sub-Å electron beams

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