Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope-Reference-Cited by-同舟云学术

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Published:2011-06 Issue:7 Volume:111 Page:877-886
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wang Peng,Behan Gavin,Kirkland Angus I.,Nellist Peter D.,Cosgriff Eireann C.,D’Alfonso Adrian J.,Morgan Andrew J.,Allen Leslie J.,Hashimoto Ayako,Takeguchi Masaki,Mitsuishi Kazutaka,Shimojo Masayuki

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Principles of Three Dimensional Imaging in Confocal Microscopes;Gu,1996

2. Submicron imaging of buried integrated circuit structures using scanning confocal electron microscopy;Frigo;Applied Physics Letters,2002

3. Principles of Optics;Born,1980

4. O. Scherzer Über einige Fehler von Elektronenlinsen, Zeitschrift für Physik 101 (1936) 593–603.

5. Direct sub-angstrom imaging of a crystal lattice;Nellist;Science,2004

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Seeing structural evolution of organic molecular nano-crystallites using 4D scanning confocal electron diffraction (4D-SCED);Nature Communications;2022-05-25

2. Machine learning in scanning transmission electron microscopy;Nature Reviews Methods Primers;2022-03-03

3. Notes and References;Principles of Electron Optics, Volume 3;2022

4. Scanning confocal electron diffraction (SCED): high angular resolution diffraction imaging with order-of-magnitude improved dose efficiency;Microscopy and Microanalysis;2021-07-30

5. Introduction;Quantitative Atomic-Resolution Electron Microscopy;2021