Image acquisition with immersion objective lenses using electrons emitted with several tenths of an electron volt energies: Towards high spatial resolution ESCA analysis-Reference-Cited by-同舟云学术

Image acquisition with immersion objective lenses using electrons emitted with several tenths of an electron volt energies: Towards high spatial resolution ESCA analysis

Published:2006-03 Issue:4-5 Volume:106 Page:398-412
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bernheim M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. Electron Optics and Electron Microscope;Zworykin,1957

2. P. Grivet, M.Y. Bernard, F. Bertein, R. Castaing, M. Gauzit, A. Septier, Optique Electronique I and II, Bordas, 1958; English edition, Electron Optics, P. Grivet, revised by A. Septier, translated by P.W. Hawkes, Pergamon, Oxford, 1965, last edition, 1989

3. Principle of Electron Optics, I, II, II;Hawkes,1989

4. Handbook of Charged Particle Optics;Orloff,1997

5. The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sources

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