Analysis of the process of anodization with AFM
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Modification of hydrogen‐passivated silicon by a scanning tunneling microscope operating in air
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1. Effect of the tip-sample contact force on the nanostructure size fabricated by local oxidation nanolithography;Ultramicroscopy;2012-04
2. SILICON NANOWIRE TRANSISTOR FABRICATED BY AFM NANOLITHOGRAPHY FOLLOWED BY WET CHEMICAL ETCHING PROCESS;International Journal of Nanoscience;2010-08
3. AFM based anodic oxidation and its application to oxidative cutting and welding of CNT;Science in China Series E: Technological Sciences;2009-11
4. Friction-induced nanofabrication on monocrystalline silicon;Nanotechnology;2009-10-22
5. Control of Atomic Step Shape and Step Flow Speed using the Effect of Si Oxidized Films;Hyomen Kagaku;2009
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