Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sections

Author:

Skoupy Radim,Nebesarova Jana,Slouf MiroslavORCID,Krzyzanek VladislavORCID

Funder

Czech Science Foundation

Ministry of Education, Youth and Sports of the Czech Republic and European Commission

Czech Academy of Sciences

the Technology Agency of the Czech Republic

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

1. Scanning Electron Microscopy for the Life Sciences;Schatten,2013

2. STEM tomography in cell biology;Yakushevska;J. Struct. Biol.,2007

3. Application of low-energy scanning transmission electron microscopy for the study of Pt-nanoparticle uptake in human colon carcinoma cells;Blank;Nanotoxicology,2014

4. Methods of Preparation for Electron Microscopy;Robinson,1987

5. Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy;McMullan;Ultramicroscopy,2014

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