Indexing electron backscatter diffraction patterns with a refined template matching approach-Reference-Cited by-同舟云学术

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Indexing electron backscatter diffraction patterns with a refined template matching approach

Published:2019-12 Issue: Volume:207 Page:112845
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Foden A.^ORCID,Collins D.M.,Wilkinson A.J.^ORCID,Britton T.B.^ORCID

Funder

Shell

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. Strains, planes, and ebsd in materials science;Wilkinson;Mater. Today,2012

2. Dynamical simulation of electron backscatter diffraction patterns;Winkelmann,2009

3. A comparison of diffraction techniques for the sem;Dingley;Scan. Electron. Microsc.,1981

4. Diffraction from sub-micron areas using electron backscattering in a scanning electron microscope;Dingley;Scan. Electron. Microsc.,1984

5. Title;Dingley,1989

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