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Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscope

  • Published:2019-07 Issue: Volume:202 Page:107-113
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Kawasaki Takeshi,Akashi Tetsuya,Kasuya Keigo,Shinada Hiroyuki

Funder

Japan Society for the Promotion of Science

Council for Science, Technology and Innovation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. A high-resolution scanning transmission electron microscope;Crewe;J. Appl. Phys.,1968

2. A simple scanning electron microscope;Crewe;Rev. Sci. Instr.,1969

3. Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution;Akashi;Appl. Phys. Lett.,2015

4. Magnetic field superimposed cold field emission gun under extreme-high vacuum;Kasuya;J. Vac. Sci. Technol. B,2014

5. Some general considerations concerning the optics of the field emission illumination system;Veneklasen;Optik,1972

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1. Evaluation of Virtual Source Size Measurement System for a Field Emission Electron Gun;2024 37th International Vacuum Nanoelectronics Conference (IVNC);2024-07-15

2. Ultracoherent Single‐Electron Emission of Carbon Nanotubes;Advanced Materials;2023-06-27

3. Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sources;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

4. Preface;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

5. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023
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