Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Interpretability of high-resolution transmission electron microscopy images;Ultramicroscopy;2024-09
2. A robust synthetic data generation framework for machine learning in high-resolution transmission electron microscopy (HRTEM);npj Computational Materials;2024-07-29
3. Generalization Across Experimental Parameters in Neural Network Analysis of High-Resolution Transmission Electron Microscopy Datasets;Microscopy and Microanalysis;2024-01-29
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