Visualization of molecular stacking using low-energy electron microscopy-Reference-Cited by-同舟云学术

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Visualization of molecular stacking using low-energy electron microscopy

Published:2023-11 Issue: Volume:253 Page:113799
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Procházka Pavel,Čechal Jan

Funder

Ministerstvo Školství, Mládeže a Tělovýchovy

Grantová Agentura České Republiky

Central European Institute of Technology

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference35 articles.

1. Low energy electron microscopy;Bauer;Rep. Prog. Phys.,1994

2. Low-energy electron microscopy;Tromp;IBM J. Res. Dev.,2000

3. Trends in low energy electron microscopy;Altman;J. Phys. Condens. Matter,2010

4. Low-energy electron microscopy;de la Figuera,2013

5. Surface microscopy with low energy electrons: LEEM;Bauer;J. Electron Spectros. Relat. Phenom.,2020

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Identification of CoPc + F₁₆CuPc Chiral Domains by LEEM with the Molecular Structure Factor;The Journal of Physical Chemistry C;2024-03-18

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