Circular dichroism in hard X-ray photoelectron diffraction observed by time-of-flight momentum microscopy-Reference-Cited by-同舟云学术

Circular dichroism in hard X-ray photoelectron diffraction observed by time-of-flight momentum microscopy

Published:2023-08 Issue: Volume:250 Page:113750
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Tkach O.^ORCID,Vo T.-P.^ORCID,Fedchenko O.,Medjanik K.,Lytvynenko Y.,Babenkov S.,Vasilyev D.,Nguyen Q.L.,Peixoto T.R.F.,Gloskowskii A.,Schlueter C.,Chernov S.,Hoesch M.,Kutnyakhov D.,Scholz M.,Wenthaus L.,Wind N.,Marotzke S.,Winkelmann A.,Rossnagel K.,Minár J.,Elmers H.-J.,Schönhense G.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference74 articles.

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