Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference45 articles.
1. Transmission electron microscope calibration methods for critical dimension standards;Orji;J. Micro/Nanolithography MEMS MOEMS,2016
2. Calibration of scanning electron microscope magnification standards SRM-484;Fu,1996
3. C. Copeland, B. Ilic, S. Stavis, Experimental Variation of Magnification Calibration for Localization Microscopy, in: OSA Frontiers in Optics Laser Science APS/DLS, Washington, DC, 2019.
4. Automatic magnification determination of electron cryomicroscopy images using apoferritin as a standard;Wasilewski;J. Struct. Biol.,2012
5. Active pixel sensor array as a detector for electron microscopy;Milazzo;Ultramicroscopy,2005
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