TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing-Reference-Cited by-同舟云学术

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TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing

Published:2023-08 Issue: Volume:250 Page:113738
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Landers David,Clancy Ian,Dunin-Borkowski Rafal E.,Weber Dieter,Stewart Andrew^ORCID

Funder

Irish Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference60 articles.

1. LiberTEM: Software platform for scalable multidimensional data processing in transmission electron microscopy;Clausen;J. Open Source Softw.,2020

2. Johnstone, D. N. et al. pyxem/pyxem: pyxem 0.10.0. (2019). 10.5281/ZENODO.3533653.

3. hyperspy/hyperspy: Release v1.6.5;De La Peña;zndo,2021

4. AtomAI framework for deep learning analysis of image and spectroscopy data in electron and scanning probe microscopy;Ziatdinov;Nat. Mach. Intell.,2022

5. Jupyter Notebooks – a publishing format for reproducible computational workflows;Kluyver,2016

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1. TEMGYM Advanced – NanoMi lens characterisation;Micron;2023-06

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