Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging-Reference-Cited by-同舟云学术

Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

Published:2014-11 Issue: Volume:146 Page:33-38
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Garcia Alejandra,Raya Andres M.,Mariscal Marcelo M.,Esparza Rodrigo,Herrera Miriam,Molina Sergio I.,Scavello Giovanni,Galindo Pedro L.,Jose-Yacaman Miguel,Ponce Arturo

Funder

National Center for Research Resources

National Institute on Minority Health and Health Disparities

NSF

NSF PREM

MINECO

Junta de Andalucía

CONICET

ANPCyT

Universidad Nacional de Cordoba

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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