Characterization of an indirect X-ray imaging detector by simulation and experiment-Reference-Cited by-同舟云学术

Characterization of an indirect X-ray imaging detector by simulation and experiment

Published:2015-01 Issue: Volume:148 Page:20-24
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Doshi C.,van Riessen G.,Balaur E.,de Jonge M.D.,Peele A.G.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Computed Tomography: Principles, Design, Artifacts, and Recent Advances;Hsieh,2009

2. Using X-ray computed tomography in hydrology: systems, resolutions, and limitations;Wildenschild;J. Hydrol.,2002

3. Detectors for synchrotron tomography;Graafsma,2008

4. X-ray detectors for digital radiography;Yaffe;Phys. Med. Biol.,1997

5. The sensitivity and spatial resolution dependence on the microstructures of CsI:Tl scintillation layer for X-ray imaging detectors;Cha;Nucl. Instrum. Methods Phys. Res. Sect. A: Accel. Spectrom. Detect. Assoc. Equip.,2010

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X‐ray Spectroscopy;Small Methods;2022-09-30

2. Growth mechanism of polycrystalline CsI(Tl) films on glass and single crystal Si substrates;Journal of Crystal Growth;2019-01

3. References;X-Ray Imaging;2016-10-10

4. Structure and scintillation properties of CsI(Tl) films on Si single crystal substrates;Applied Surface Science;2016-10

5. Fabrication and Performance of Micron Thick CsI(Tl) Films for X-Ray Imaging Application;IEEE Transactions on Nuclear Science;2016-06