The experimental electron mean-free-path in Si under typical (S)TEM conditions
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
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4. Determination of absolute thickness and mean free path of thin foil specimen by the ζ–factor method;Ohshima;J. Electron Microsc.,2004
5. EELS log-ratio technique for specimen-thickness measurements in the TEM;Malis;J. Electron Microsc. Tech.,1988
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