Enhanced quantification for 3D SEM–EDS: Using the full set of available X-ray lines-Reference-Cited by-同舟云学术

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Enhanced quantification for 3D SEM–EDS: Using the full set of available X-ray lines

Published:2015-01 Issue: Volume:148 Page:158-167
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Burdet Pierre^ORCID,Croxall S.A.,Midgley P.A.

Funder

European Research Council

European Union׳s Seventh Framework Programme

Rolls-Royce plc

EPSRC

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. The Superalloys: Fundamentals and Applications;Reed,2006

2. Scanning Electron Microscopy and X-ray Microanalysis;Goldstein,2003

3. Electron Probe Quantitation;Heinrich,1991

4. Detailed Tabulation of Atomic Form Factors, Photoelectric Absorption and Scattering Cross Section, and Mass Attenuation Coefficients in the Vicinity of Absorption Edges in the Soft X-Ray (Z=30–36, Z=60–89, E=0.1 keV–10 keV), Addressing Convergence Issues of Earlier Work

5. Uncertainty estimates for electron probe X-ray microanalysis measurements;Ritchie;Anal. Chem.,2012

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