Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images’ quality-Reference-Cited by-同舟云学术

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Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images’ quality

Published:2018-11 Issue: Volume:194 Page:100-107
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Kopiec Daniel,Jóźwiak Grzegorz,Moczała Magdalena,Sierakowski Andrzej,Gotszalk Teodor

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Deposition and imaging of localized charge on insulator surfaces using a force microscope;Stern;Appl. Phys. Lett.,1988

2. Kelvin probe force microscopy;Nonnenmacher;Appl. Phys. Lett.,1991

3. Surface potential mapping : a qualitative material contrast in SPM;Jacobs;Ultramicroscopy,1997

4. Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever;Rodriguez;Appl. Phys. Lett.,2004

5. Multifrequency electrostatic force microscopy in the repulsive regime;Stark;Nanotechnology,2007

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