Funder
DFG, German Research Foundation)
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference41 articles.
1. Specimen thickness determination in TEM in the general case;von Heimendahl;Micron,1973
2. Practical Electron Microscopy in Materials Science;Edington,1976
3. Defect Analysis in Electron Microscopy;Loretto,1975
4. CTEM versus STEM versus HVEM: evaluation of the three-dimensional morphology of arsenic inclusions;Ramirez-Mitchell;J. Electron Microsc. Tech.,1985
5. Estimate of foil thickness by stereomicroscopy technique;Dlouhý;Czechoslov. J. Phys.,1990
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献