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Introduction and comparison of new EBSD post-processing methodologies

  • Published:2015-12 Issue: Volume:159 Page:81-94
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Wright Stuart I.,Nowell Matthew M.,Lindeman Scott P.,Camus Patrick P.,De Graef Marc,Jackson Michael A.

Funder

Air Force Office of Scientific Research

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Electron Backscatter Diffraction in Materials Science;Schwartz,2009

2. Orientation imaging: the emergence of a new microscopy;Adams;Metall. Trans. A,1993

3. Automatic-analysis of electron backscatter diffraction patterns;Wright;Metall. Trans. A,1992

4. Advances in automatic EBSP single orientation measurements;Kunze;Texture Microstruct.,1993

5. Review-grain and subgrain characterization by electron backscatter diffraction;Humphreys;J. Mater. Sci.,2001

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