Brief history of the Cambridge STEM aberration correction project and its progeny-Reference-Cited by-全球学者库

Brief history of the Cambridge STEM aberration correction project and its progeny

Published:2015-10 Issue: Volume:157 Page:88-90
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Brown L. Michael,Batson Philip E.,Dellby Niklas,Krivanek Ondrej L.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference42 articles.

1. In quest of perfection in electron optics: a biographical sketch of Harald Rose on the occasion of his 80th birthday;Urban;Ultramicroscopy,2015

2. Achromatic quadrupole electron lenses;Kel’man;Zh. Tekh. Fiz.,1961

3. S. Senoussi, Etude d’un dispositive de filtrage des vitesses purement magnétique adaptable à un microscope électronique à très haute tension (Ph.D. thesis), University Paris-Orsay, 1971.

4. On the fifth-order aberration in a sextupole-corrected probe forming system;Shao;Rev. Sci. Instrum.,1988

5. S. Derra, Crewe plans STEM to resolve 0.5Å, Industrial Research and Development, March 1983, pp. 51–52.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Progress in atomic-resolution aberration corrected conventional transmission electron microscopy (CTEM);Progress in Materials Science;2023-03

2. Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sources;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

3. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

4. Imaging defects in two-dimensional crystals by convergent-beam electron diffraction;Physical Review B;2022-05-31

5. OUP accepted manuscript;Microscopy;2022