Author:
Yuan Renliang,Zhang Jiong,He Lingfeng,Zuo Jian-Min
Funder
University of Illinois at Urbana-Champaign
Idaho National Laboratory
Intel Corp
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference40 articles.
1. STEM imaging of crystals and defects;Humphreys,1979
2. Advanced Transmission Electron Microscopy, Imaging and Diffraction in Nanoscience;Zuo,2017
3. Chapter 77 Experimental studies of dislocation core defects;Spence;Dislocations in Solids,2007
4. Chapter 11 Atomic-Resolution Aberration-Corrected Transmission Electron Microscopy;Urban,2008
5. Direct Imaging of Dopant and Impurity Distributions in 2D MoS2;Kim;Adv. Mater.,2020
Cited by
21 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献