Combining quantitative ADF STEM with SiNx membrane-based MEMS devices: A simulation study with Pt nanoparticles-Reference-Cited by-同舟云学术

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Combining quantitative ADF STEM with SiNx membrane-based MEMS devices: A simulation study with Pt nanoparticles

Published:2021-12 Issue: Volume:231 Page:113270
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

MacArthur Katherine E.,Clement Antoine,Heggen Marc,Dunin-Borkowski Rafal E.

Funder

Helmholtz Association

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference54 articles.

1. Atom-resolved imaging of dynamic shape changes in supported copper nanocrystals;Hansen;Science (80-.),2002

2. Multi-Scale Red-Ox Dynamics of Active Metal Catalysts Revealed by a Combination of In Situ Scanning and Transmission Electron Microscopy;Farra;Microsc. Microanal.,2017

3. High gas pressure /high temperature in situ investigation of nanomaterials by STEM-EELS;Abellan;Microsc. Microanal.,2012

4. When is Si3N4 not Si3N4? When it is a Low Stress SiNx Membrane Window;Zaluzec;Microsc. Microanal.,2015

5. Developments in in situ environmental cell high-resolution electron microscopy and applications to catalysis;Gai;Top. Catal.,2002

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