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Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel

  • Published:2021-03 Issue: Volume:222 Page:113210
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Moore Stacy,Warren Alexander D.,Burrows Robert,Payton Oliver D.,Picco Loren,Russell-Pavier Freddie S.,Martin Peter G.,Martin Tomas L.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference47 articles.

1. Atomic force microscope;Binnig;Phys. Rev. Lett.,1986

2. Operation of astigmatic-detection atomic force microscopy in liquid environments;Liao;Rev. Sci. Instr.,2013

3. Design and modeling of a high-speed afm-scanner;Schitter;IEEE Trans. Control Syst. Tech.,2007

4. High-speed atomic force microscopy in slow motion—understanding cantilever behaviour at high scan velocities;Payton;Nanotechnology,2012

5. O. D.Payton, High-speed atomic force microscopy under the microscope. PhD thesis, University of Bristol, 2012.
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