Near-simultaneous dual energy range EELS spectrum imaging-Reference-Cited by-同舟云学术

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Near-simultaneous dual energy range EELS spectrum imaging

Published:2008-11 Issue:12 Volume:108 Page:1586-1594
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Scott J.,Thomas P.J.,MacKenzie M.,McFadzean S.,Wilbrink J.,Craven A.J.,Nicholson W.A.P.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Electron Energy Loss Spectroscopy in the Electron Microscope;Egerton,1996

2. Real structure of the CoSi2∕Si(001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy

3. Spectrum-image: The next step in EELS digital acquisition and processing

4. A fast beam switch for controlling the intensity in electron energy loss spectrometry

5. Electron Energy Loss Near Edge Structure (ELNES) on the Carbon K-Edge in Transition Metal Carbides with the Rock Salt Structure

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