Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:-Reference-Cited by-同舟云学术

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Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:

Published:2008-11 Issue:12 Volume:108 Page:1558-1566
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Cosgriff E.C.,D’Alfonso A.J.,Allen L.J.,Findlay S.D.,Kirkland A.I.,Nellist P.D.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography

2. Depth sectioning with the aberration-corrected scanning transmission electron microscope

3. Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope

4. Reconstruction of 3D morphology of polyhedral nanoparticles

5. Three-dimensional imaging of stacked Pd nanoparticles by electron tomography

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2. Towards real‐time STEM simulations through targeted subsampling strategies;Journal of Microscopy;2023-02-27

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5. Analysis of depth-sectioning STEM for thick samples and 3D imaging;Ultramicroscopy;2019-12

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