Measurement method of aberration from Ronchigram by autocorrelation function-Reference-Cited by-同舟云学术

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Measurement method of aberration from Ronchigram by autocorrelation function

Published:2008-10 Issue:11 Volume:108 Page:1467-1475
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Sawada H.,Sannomiya T.,Hosokawa F.,Nakamichi T.,Kaneyama T.,Tomita T.,Kondo Y.,Tanaka T.,Oshima Y.,Tanishiro Y.,Takayanagi K.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Electron microscopy image enhanced

2. Towards sub-Å electron beams

3. A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

4. First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy

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